A Metric Learning Based System for Retail Product Recognition and Novel Class Discovery
作者：
Yalciner, Ibrahim Samil;Genc, Zubeyir;Cakil, Lutfu;Ekenel, Hazim Kemal
通讯作者：
Yalçiner, IS
作者机构：
Istanbul Tech Univ, Istanbul, Turkiye.
REM People, Istanbul, Turkiye.
通讯机构：
Istanbul Tech Univ, Istanbul, Turkiye.
语种：
英文
关键词：
metric learning,novel class discovery,retail
期刊：
2023 31ST SIGNAL PROCESSING AND COMMUNICATIONS APPLICATIONS CONFERENCE, SIU
ISSN：
2165-0608
年：
2023
会议名称：
31st IEEE Conference on Signal Processing and Communications Applications (SIU)
会议时间：
JUL 05-08, 2023
会议地点：
Istanbul Tech Univ, Ayazaga Campus, Istanbul, TURKEY
摘要：
Developing a retail product recognition system presents different challenges compared to traditional object recognition systems. Retail products contain classes that are very similar to each other but differ in small details. The current product classes in the system must be frequently expanded with new product classes or updated with packaging changes. For these reasons, we developed a metric learning-based product recognition system that provides superior product recognition performance and the ability to add new products and update existing ones. The key components of our system are the ConvNext_nano feature extractor, ArcFace loss, feature vector database, similarity ...
